基于数字全息技术的材料表面特性测量研究  

Measurements of the Characteristics of Transparent Material using Digital Holography

作　　者：尚文宾 杨鸿[1] 杨恒虎 张峰[1] 杨岩[1] 

机构地区：[1]重庆理工大学机械工程学院,重庆400054

出　　处：《激光杂志》2014年第6期23-27,共5页Laser Journal

基　　金：中国国家自然科学基金(11272368)资助项目

摘　　要：数字全息应用于对透明材料表面特性测量研究。在本文中,建立了一个测量透明材料表面特性的数字全息图记录系统,可以获得高质量的透明物体的数字全息图。经过对全息图进行后处理和最小二乘法解包裹算法获得透明物体的相位重建图。可以测定材料的表面特性,并对其进行三维可视化显示。利用NanoMap500Ls作为验证试验,验证试验的结果表明数字全息在测量透明材料方面是一个可行的测量工具。Digital holography is applied to measure the characteristics of transparent material. A digital hologram recording system to measure the surface of transparent material was established, and the digital holograms of transparent object were obtained in high quality. For post-processing of hologram, the least-squares phase unwrapping algorithm was used in phase unwrapping and the phase reconstruction image of transparent object was obtained. The information of material surfaces was measured and the characteristic was presented in 3D visualization. The validation experiment was conducted by NanoMap 500LS system, the results of validation experiment are well satisfied with the measurement by digital holography, which proved the feasibility of digital holographic technology as a good measurement tool for transparent material.

关 键 词：透明 数字全息 测量 

分 类 号：TN244.8[电子电信—物理电子学]