不同方法测定两种表面活性剂的临界胶束浓度  

Critical Micelle Concentration of Surfactant Determined by Two Different Method

作　　者：杨锐[1] 杨春花[1] 王力峰[1] 梁斌[1] 

机构地区：[1]宁夏大学化学化工学院,宁夏银川750021

出　　处：《广州化工》2014年第12期116-118,共3页GuangZhou Chemical Industry

基　　金：宁夏自然科学基金项目(NZ12143)

摘　　要：采用电导法及表面张力法分别测定了十二烷基硫酸钠(阴离子表面活性剂)和十二烷基三甲基氯化铵(阳离子表面活性剂)的临界胶束浓度,两种实验方法测得十二烷基硫酸钠的临界胶束浓度约为7.0×10-3mol·dm-3,十二烷基三甲基氯化铵的临界胶束浓度约为1.60×10-2mol·dm-3,两种方法所得结果一致。Critical micelle concentration of two surfactants was determined by conductometric method and surface tension method.The experiment result showed that the critical micelle concentration of sodium dodecyl sulphate was 7.0 × 10 -3 mol · dm -3 and the critical micelle concentration of twelve alkyl three methyl ammonium chloride was 1.60 × 10 -2 mol· dm -3.The results of the two methods for the determination had the same results.

关 键 词：电导法 表面张力法 临界胶束浓度(CMC) 十二烷基硫酸钠(C12H25SO4Na) 十二烷基三甲基氯化铵(C15H34ClN) 

分 类 号：O657.91[理学—分析化学]