X荧光光谱法快速测定手机有害元素含量  

Rapid Determination of Harmful Element Contents in the Mobile- phone by X- ray Fluorescence Spectrometry

作　　者：刘祥军[1] 陈燕舞[1] 杨雅兰[1] 黄思琪[1] 梁木春 叶俊英[1] 

机构地区：[1]顺德职业技术学院应用化工技术学院,广东佛山528333

出　　处：《广州化工》2014年第12期131-132,166,共3页GuangZhou Chemical Industry

摘　　要：采用X荧光光谱仪快速分析20款手机表面的Cr、Cd、Pb、Hg以及Br等多种RoHS限制的有害元素含量。该方法对不同大小,形状,品牌的手机可不做任何的预处理,直接无损测定其表面有害元素。测定结果表明,抽查的20款手机,整体表现优秀,合格率达到95%;方法精密度良好。Fast analysis of harmful elements in the 20 mobile phone surface , such as Cd, Cr, Pb, Hg and Br, in which RoHS restricted by X -ray fluorescence spectrometry.Without any sample pretreatment , the concentration of harmful elements in samp 1 es with different sizes , shapes and brands can be detected.The determination results showed that spot checks of the 20 mobile phone , qualifiedrate reached 95%, and the precision of the method was good.

关 键 词：X荧光光谱法 手机 ROHS 有害元素 

分 类 号：O657.34[理学—分析化学]