基于性能退化模型的空间电子学设备加速寿命试验研究与应用  

Study and Applications of Accelerated Life Tests for Space-Electronic Equipments Based on a Performance Degradation Model

作　　者：伏洪勇[1] 党炜[1] 李锴[2] 

机构地区：[1]中国科学院空间应用工程与技术中心,北京100094 [2]中国科学院光电研究院,北京100094

出　　处：《载人航天》2014年第3期267-272,共6页Manned Spaceflight

基　　金：载人航天工程空间应用支持(09011009)

摘　　要：对基于Arrhenius模型、Norris-Landzberg模型和Peck模型等模型的加速寿命试验理论进行了简要阐述,针对空间应用系统空间电子学设备可靠性特点和加速寿命试验难点,提出了一种基于性能退化模型的电子学整机系统加速应力试验方法,最后给出了实例,为减少试验设计中的不确定性因素提供了一种新的思路。The accelerated life test theories based on Arrhenius , Norris-Landzberg and Peck models were briefly introduced .Targeting the reliability features and the difficulties of accelerated life tests , an accelerated stress test method for space-electronic equipments was proposed based on a perform-ance degradation model .In the end , application examples were given to verify the proposed method . This provides a brand new idea for the reduction of uncertainties in the test design stage .

关 键 词：性能退化模型 空间电子设备 加速寿命试验 激活能 温度应力 温度变化 

分 类 号：V416.3[航空宇航科学与技术—航空宇航推进理论与工程]