用光切法测量表面粗糙度R_Z、S值的实验研究  

Experimental Research on Surface Roughness of R_Z and S by Using Light-Section Method

作　　者：杨晓红[1] 

机构地区：[1]盐城工学院机械工程系,江苏盐城224003

出　　处：《实验室研究与探索》2000年第5期50-53,共4页Research and Exploration In Laboratory

摘　　要：用光切法测量表面粗糙度 RZ、S值可实现对表面轮廓要求的二维控制。介绍了原理、操作、处理等方面的技术细节 ,对工程应用具有指导价值。The measurements of surface roughness of R Z and S by using light section method may realize two dimensional control of surface profile. This article introduced technical details of the theories, operations and treatment etc. These were also useful to the engineering application.

关 键 词：光切法 RZ值 S值 单峰平均间距 峰谷 表面粗糙度测量 光切显微镜 

分 类 号：TG84[金属学及工艺—公差测量技术]