微量杂质对As-Se-Te玻璃红外光纤损耗的影响  

Effect of Trace Impurities on Loss of As-Se-Te Glass Infrared Fiber

作　　者：吕步云[1] 杨克武[1] 梁汉东[2] 薛洪逵[1] 

机构地区：[1]北京玻璃研究院,北京100062 [2]中国矿业大学北京校区,北京100083

出　　处：《激光与红外》2001年第2期121-123,共3页Laser & Infrared

基　　金：1999年北京市青年科技骨干培养基金资助项目

摘　　要：对 As- Se- Te玻璃原料提纯和熔制工艺进行改进。制成具有芯包结构、阶跃折射率的红外玻璃光纤。对 As- Se- Te玻璃进行微量杂质分析。同时 ,对拉制成的 As- Se- Te玻璃红外光纤测试其损耗。结果表明 :工艺改进后 ,光纤损耗值降低与玻璃微量杂质总 (正、负 )Purifing of As Se Te glass raw element and melting technology were improved.As Se Te glass infrared fibers with a core cladding structure and step refractive index were fabricated.The trace impurities in As Se Te glass is measured.The loss of As Se Te glass infrared fiber is measured .It is shown that the reductions of fiber loss and reductions of relative proportionality of total ion counts were concurrent.

关 键 词：As-Se-Te玻璃红外光纤 光纤损耗 微量杂质 

分 类 号：TN253[电子电信—物理电子学]