X射线衍射定向仪自动测控系统  

Automatic measure & control system of X-ray diffraction goniometer

作　　者：王悦敏[1] 钱力鹏[1] 杜彦从[1] 

机构地区：[1]清华大学工程物理系,北京100084

出　　处：《核电子学与探测技术》2001年第2期117-120,共4页Nuclear Electronics & Detection Technology

摘　　要：介绍了 X射线衍射定向仪的工作原理 ,并对 X射线衍射定向仪的自动测控系统的设计进行了描述。目前该测控系统测量人造单晶晶体晶面角时 ,测量精度能达到 2 0″,接近国际领先水平。This paper describes the design of Automatic Measurement & Control System of X Ray Diffraction Goniometer. It has an originally hardware design with I 2C bus,rapid A/D convert module and high precision rotary encoder. And that make it high accuracy(about 20″)and high extensibility (easy to change many functions without changing the hardware).

关 键 词：倒易矢量 晶体面间距 角编码器 人造单晶 晶面角测量 X射线衍射定向仪 自动测控系统 

分 类 号：TH741.2[机械工程—光学工程]