质子轰击Gd、Eu和Nd引起的L亚壳层电离  

L-subshell ionization for Gd, Eu and Nd by protons

作　　者：刘兆远[1] 张华林[1] 马树勋[1] 杨坤山[1] 

机构地区：[1]兰州大学

出　　处：《核技术》1991年第1期36-40,共5页Nuclear Techniques

摘　　要：用0.4—2.75MeV质子轰击稀土元素Gd、Eu和Nd靶,测得L亚壳层的X射线产生截面。利用亚壳层的荧光产额和Coster-Kronig跃迁几率的半经验值,求得2S_(1,2)、2P_(1/2)和2P_(3/2)三个亚壳层的电离截面。实验测得的电离截面以及它们的比值与ECPSSR理论预言值进行了比较。Rare-earth element targets of Gd, Eu and Nd were bombarded by protons with energies between 0.4 and 2.75MeV. The L-subshell X-ray production cross-sections were measured, and the ionization cross-sections of 2S1/2, 2P1/2 and 2P3/2 subshells were obtained. Experimental ionization cross-sections and their ratios were compared with the prediction of ECPSSR theory.

关 键 词：GD EU ND L亚壳层 电离截面 

分 类 号：O562.4[理学—原子与分子物理]