钽—铋原子L次壳层空位的衰变产额  

Decay yields of atomic L-subshell vacancies for elements Ta to Bi

作　　者：徐君权[1] 

机构地区：[1]中国科学院上海原子核研究所

出　　处：《核技术》1991年第10期589-596,共8页Nuclear Techniques

基　　金：国家自然科学基金

摘　　要：我们建立了重元素L壳层空位退激过程的计算模型。利用这个模型,分析了Croldberg用50keV电子激发金属元素、用弯晶谱仪测量到的LX射线强度谱,从而求得了从Ta到Bi 10个元素的L_1、L_2和L_3次壳层荧光产额ω_1、ω_2和ω_3。它们都与近几年国际上发表的实验值相符,但在Z=80号元素附近明显地与Krause的半经验汇编值不同。本工作得到的ω_1值在Z≈80处大约比汇编值大20％,比Chen等的理论值大55％。A new calculation model for L-vacancy deexcitation processes of heavy elements has been put forward. By using the model, Goldberg's LX-ray intensity spectra produced by 50 keV electron impact on metallic elements and measured by a curved crystal spectrometer were analyzed, and the L-subshell fluorescence yields of ten elements ranging from Ta to Bi were obtained. The Present values of ω1, ω2 and ω3 are all in good agreement with the measurements reported in recent years, but different evidently from Krause's semiempirical compilation for elements around Z = 80. The new ω1 values are about 20% more than the compiled and about 55% more than the last theoretical data for elements around Z=80.

关 键 词：钽 铋 原子 L次壳层 衰变 重元素 

分 类 号：O571[理学—粒子物理与原子核物理]