介质谐振器法测试高T_c超导材料的微波表面电阻  

MEASUREMENT OF MICROWAVE SURFACE RESISTANCE OF HIGH Tc SUPERCONDUCTOR MATERIALS BY USE OF DIELECTRIC RESONATOR

作　　者：罗正祥[1] 卢剑[1] 马(立乞)立 任向阳[1] 张其劭[1] 

机构地区：[1]电子科技大学

出　　处：《低温与超导》1992年第1期49-53,共5页Cryogenics and Superconductivity

基　　金：国家超导技术联合开发中心资助

摘　　要：本文采用介质谐振器法测量高T_C超导材料微波表面电阻。上下端面被金属板短路的介质谐振器构成TE_(011)模式,将其中一个底板置换为被测超导样品,通过测试其无载品质因素Q_0和谐振频率f_0的变化,计算测试样品的微波表面电阻。实验证明,这种方法具有重复性好,测试稳定的特点,可以对高T_C超导块材和薄膜样品进行非损伤测试。A. method of dielectric resonator is used for measuring the microwave surface resistance of high Tc superconductor materials in this paper. The dielectric resonator, short-circuited by two metal plates on both onds of the dielectric resonator, forms TE0.11 mode, then one of the me tal plates is replaced by a test superconducting sample, According to the change of the unloaded Q factor and resonant frequency F0 of the dielectric resonator system, the microwave surface resistance Rs of the test superconducting sample can be calculated.Advantages of this method include high sensitivity, stability, and go od repcativity. This method can be used for nondcstructed measurment of high Tc superconducting material bulk and film.

关 键 词：微波 谐振器 阻抗 测量 超导性 超导材料 

分 类 号：TM260.144[一般工业技术—材料科学与工程]