再谈高纯锗探测器的GeKα逃逸峰强度问题  

Again on the Intensity of the GeKa Escape Peakin HPGe Detector

作　　者：谢东[1] 严振庄[1] 张礼华[2] 张炳岳[2] 

机构地区：[1]河北师范大学,石家庄050016 [2]扬州师范学院,225002

出　　处：《核电子学与探测技术》1992年第6期347-351,共5页Nuclear Electronics & Detection Technology

摘　　要：本文详细推导并讨论了在各种实验条件下,高纯锗探测器的GeKα逃逸峰强度的计算公式。In this paper the authors have led the formulas for calculation pf the y intensity of the GeKa escape peak in HPGe detector under different experime nt-conditions, and has corrected the mistakes on calculation of iodine escape peak in the book 'Applied Gamma-Ray Spectrometry' that was edited by G. E. Orouthamel.

关 键 词：探测器 闪烁探测器 逃逸峰 锗 

分 类 号：TL812[核科学技术—核技术及应用]