SiCw/Al复合材料基体屈服强度的X射线测量  

Determination for the Yield Strength of Matrix in a SiCw/Al Composite by the X-ray Diffraction

作　　者：姜传海[1] 王德尊[2] 吴建生[1] 

机构地区：[1]上海交通大学国家教委高温材料及高温测试重点实验室,上海200030 [2]哈尔滨工业大学材料科学与工程学院,哈尔滨150001

出　　处：《材料工程》2001年第4期44-47,共4页Journal of Materials Engineering

摘　　要：根据 X射线应力测量原理建立复合材料基体屈服强度的试验方法 ,测量压铸态 2 0 vol% Si Cw/ Al复合材料中基体实际屈服强度。结果表明 ,复合材料中基体屈服强度明显高于单一基体材料 ,高位错密度及细小亚晶粒是复合材料基体强化的主要原因。According to the principle of stress measurement by X ray diffraction, the test method of matrix yield strength in composites was established The actual yield strength of matrix in a 20vol%SiCw/Al composite was measured The results show that, the matrix yield strength in the composite is obviously higher than that of single matrix material The matrix strengthening in the composite is mainly due to high dislocation density and fine sub gain

关 键 词：基体屈服强度 X射线衍射 测量 碳化碳 铝基复合材料 

分 类 号：TB333[一般工业技术—材料科学与工程]