热打印头的失效机理与寿命分析  

Degradation Causes and Life Estimation of Thermal Printing Heads

作　　者：张生才[1] 申云琴[1] 姚素英[1] 

机构地区：[1]天津大学电子信息工程学院,天津300072

出　　处：《电子科技大学学报》2001年第2期181-184,共4页Journal of University of Electronic Science and Technology of China

基　　金：国家重点科技公关项目

摘　　要：在对热印头进行高温存储实验、震动实验、脉冲加热实验和实际打印实验的基础上，总结出热印头失效的五种模式，并分析了各种模式的失效原因；论述了提高热印头寿命的措施。Long lifetime is a base for thermal printing heads to be applied widely. Experiments on these thermal printing heads include high temperature storage tests, shaking tests, pulse-heat tests, and actual thermal printing tests. From the experiments, five degradation modes of thermal printing heads are summarized. The degradation reasons for the five modes are analyzed and the means of increasing the lifetime of thermal printing heads are demonstrated.

关 键 词：薄膜热印头 热打印机 失效机理 热打印头 

分 类 号：TP334.8[自动化与计算机技术—计算机系统结构]