导电涂膜表面微米尺度内痕量CIO-浓度测定方法的研究  

Research into test method of trace CIO^- concentration within micrometer scale of conductive film surface

作　　者：孙祖信[1] 叶章基[1] 吴诤 宋文桑 林仲华[2] 吴玲玲[2] 

机构地区：[1]中国船舶重工集团公司七院七二五所厦门分部,361002 [2]厦门大学固体表面物理化学国家重点实验室,361005

出　　处：《上海涂料》2001年第2期3-7,33,共6页Shanghai Coatings

摘　　要：简述采用四电极体系,锁相相关测定系统及三维微控装置,测定了电解人造海水在导电涂膜表面微米尺度内痕量C10-浓度的分布,为导电防污涂料研究的关键技术确定导电涂膜表面产生痕量C10-浓度相对应的通电参数作致关重要技术准备。By means of four electrode system, phase lock correlation system and three - dimensional mi-crocontrolled installation, we measure the distribution of electrolytic artificial sea water in trace ClO-concentration with micrometer scale of conductive film surface so as to provide utmostly important preparation for determing electrified parameter corresponding to trace ClO- concentration generated on conductive film surface.

关 键 词：导电涂膜 微米尺度 痕量浓度 导电防污涂料 

分 类 号：TQ639[化学工程—精细化工]