红外探测器频谱特性自动测量装置  

AN AUTOMATIC SYSTEM FOR MEASURING FREQUENCY PERFORMANCES OF IR DETECTORS

作　　者：石保安[1] 王惠英[1] 张爱军 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《红外研究》1990年第1期57-62,共6页

摘　　要：讨论了使用频谱仪和系统测量红外探测器频谱特性的方法，采用频谱仪的扫频装置和大功率GaAs发光二级管作为调制光源，快速测量了红外探测器的噪声谱频N(f)，响应率频谱R（f）和探测率频谱D^*(f)，复盖频率范围为3Hz-200kHz。A method for measuring freq uency performances of IR detectors by using wave analyser and microcomputer is described.Using a frequency scanning device and a GaAs LED as a modulated source, the noise frequency spectrum N(f), frequency spectra of responsivity R(f) and detectivity D~*(f) for IR detectors are fast measured over the frequency range 3Hz～200kHz.

关 键 词：频谱特性 红外探测 自动测试 红外探测器 

分 类 号：TN215[电子电信—物理电子学]