ICP-AES法测定碘化铯晶体中的铊和钠  

Determination of Thallium and Sodium in CsI Crystal by Inductively Coupled Plasma-Atomic Emission Spectrometry

作　　者：武少华[1] 姚士仲[1] 崔璐 王守兰[1] 陶志青[1] 

机构地区：[1]北京工业大学环境与能源工程学院,北京市朝阳区平乐园100号100022

出　　处：《光谱实验室》2001年第3期335-338,共4页Chinese Journal of Spectroscopy Laboratory

摘　　要：本文建立了电感耦合高频等离子体原子发射光谱法 ( ICP- AES)对碘化铯晶体中的铊和钠元素的直接同时测定方法。并对分析线的选择、溶液的酸度、基体效应、试样的溶解等条件进行了实验研究。用正交设计对仪器工作参数进行了最佳条件选择。采用本法测定碘化铯晶体中掺杂元素铊和钠的检出限分别为0 .2 1μg/ m L和 0 .0 95μg/ m L ;相对标准偏差分别为 3.7%和 2 .4 % ;加标回收率介于 87%— 10 2 %之间 ,该法简便、快速、准确 。An analytical method for the determination of microelement Tl and Na in CsI crystal by ICP AES was proposed.Experiments on the selection of the best analytical lines, the effect of acidity, the effect of matrix, the solution for samples and other conditions were made.The orthogonal design was used to choose the best operating parameters.The limits of determination by ICP AES for Tl and Na are 0.206 μg/mL and 0.095 μg/mL respectively. The relative standard deviation are 3.7% and 2.4 % respectively.The rate of recovery is 87%—102%.This method is simple,rapid,accurate and was applied to the determination of Tl and Na in CsI crystal with satisfactory result.

关 键 词：碘化铯晶体 电感耦合高频等离子体-原子发射光谱法 铊 钠 同时测定 掺杂元素 

分 类 号：O614.115[理学—无机化学]