红外探测器的1/f噪声谱测试  

1/f noise spectrum test of infrared detector

作　　者：岳冬青[1] 李燕兰[1] 

机构地区：[1]华北光电技术研究所,北京100015

出　　处：《红外与激光工程》2001年第2期155-156,共2页Infrared and Laser Engineering

摘　　要：研究红外探测器的 1 f噪声谱是为了解探测器表面处理情况 ,尽可能地降低 1 f噪声谱的转折频率。文中对 1 f噪声进行简单介绍后 ,叙述了 1 f噪声测试原理及系统组成 ,最后给出了典型的HgCdTe光导 光伏型探测器的 1 f噪声谱曲线 ,并对其进行了分析说明。The purpose of studying the 1/f noise spectrum of IR detector is to learn its the surface treatment situation and reduce the transition frequency of the 1/f noise spectrum. After briefly introduction of the 1/f noise, the measurement principle of the 1/f noise and the measuring system configuration are explained in the paper. Finally, the curves of the 1/f noise spectrum for typical HgCdTe PC/PV detectors are given and the analysis of these curves are made.

关 键 词：1/f噪声 红外探测器 电流噪声 噪声谱测试 

分 类 号：TN215[电子电信—物理电子学] TB52[理学—物理]