X-射线荧光光谱法测定溶样后熔融制样金属硅中铁、铝、钙、钛、磷、铜  

Determination of Fe,Al,Ca,Ti,P and Cu in Silicon Metal by XRF

作　　者：谷松海[1] 宋义[1] 李旭辉[1] 

机构地区：[1]天津出入境检验检疫局,天津300201

出　　处：《光谱学与光谱分析》2001年第3期400-403,共4页Spectroscopy and Spectral Analysis

摘　　要：本文提出了溶解、蒸干然后用熔剂熔融残渣的样品制备方法 ,解决了金属硅不易直接熔融制样的难题 ,可以同时测定金属硅中多种杂质元素 ,消除了基体效应的影响 ,克服了标准样品对测定的限制 ,测定范围广 ,准确度高 。This article puts forward a sample preparation method that first dissolve the sample by acid and evaporate the solution then melt the remains by flux. This method resolves the problem that silicon metal can't easy to prepare sample by fusion, and it can determine several elements in the sample simultaneously. This method overcomes the limit of standard sample and removes the matrix effects. The range of determination is wide and the results is accurate. The condition of preparing sample was confirmed by test.

关 键 词：X-射线荧光光谱法 金属硅 熔融残渣制样方法 铁 铝 钙 钛 磷 铜 测定 

分 类 号：TG115.33[金属学及工艺—物理冶金]