一种观察溶液浓度轮廓的新方法  

Novel measuring method of solution concentration profiles

作　　者：李文江[1] 徐毓娴[1] 张志利[1] 

机构地区：[1]清华大学精密仪器系,北京100084

出　　处：《光学精密工程》2001年第3期257-259,共3页Optics and Precision Engineering

基　　金：国家自然科学基金 (5 9975 0 5 2 )

摘　　要：提出了一种能够对溶液的浓度轮廓进行观察与测量的新的显微成像测量方法———暗场纹影法。这种方法是在纹影法 (SchlierenMethod)的基础上加以改进后形成的 ,能够用来对溶液的浓度轮廓进行观察。还给出了该方法原理性实验的观察结果 。A novel microscopic method(dark field type Schlidren method) for in situ mapping solution concentration profiles is presented in this paper. It was modified and improved by Schlieren method, and can be used to observe the variation of the solution concentration. In addition, the results obtained in the theoretical experiment, and comparisons with the results from a differential interference microscope are also provided.

关 键 词：纹影法 梯度折射率 溶液 浓度测量 显微观测 晶体生长 

分 类 号：O782.1[理学—晶体学]