测量聚合物薄膜电光系数的一种简单方法——干涉法  

A Simple Interferometric Method for Measuring Electro-optic Coefficients of Poled Polymer Thin Films

作　　者：尹鑫[1] 史伟[1] 房昌水[1] 

机构地区：[1]山东大学晶体材料研究所晶体材料国家重点实验室,济南250100

出　　处：《压电与声光》2001年第3期230-231,239,共3页Piezoelectrics & Acoustooptics

基　　金：国家自然科学基金!资助项目 ( 3 4 0 62)

摘　　要：报道了一种测量聚合物薄膜电光系数的简单方法。这种方法是用石英晶体的逆压电效应补偿聚合物薄膜电光效应引起的光程变化 ,测量聚合物薄膜电光系数相对于石英晶体压电常数 d1 1 的大小 ,这种方法可以用来测量所有光学薄膜的电光系数。A simple interferometric method for measuring the linear electro optic coefficients of poled polymer films is described.This is based on compensating the optical path length due to the electro optic effect of the poled polymer film by the aanti piezoelectric effect of a quartz crystal.The value of the linear electro optic coefficients of the poled polymer films relative to the piezoelectric constant all of a quartz crystal have been measured.This method can be used for measuring the linear electro optic coefficients of all optical thin films.The linear electro optic coefficients of several new poled polymer thin polymer films have been determined by using this method.

关 键 词：聚合物薄膜 电光系数 干涉法 测量 

分 类 号：O484.4[理学—固体物理]