智能镀层厚度测量仪的设计  

The Design of Intelligent Instrumentation for Coat Thickness Measuring

作　　者：俞阿龙[1] 

机构地区：[1]淮阴师范学院,江苏淮阴223001

出　　处：《自动化仪表》2001年第7期24-27,共4页Process Automation Instrumentation

摘　　要：介绍一种以MCS - 5 1单片机为核心 ,利用霍尔集成电路、集成函数运算放大器、V/F转换器等构成的镀层厚度测试仪。文末给出了性能测试结果。该测厚仪适用于导磁工件上镀(涂 )有非导磁材料的镀 (涂 )层厚度的测量。A plating thickness gauge with MCS 51 single chip computer as the kernel part is introduced. The gauge is composed of Hall IC, integrated function operational amplifier and V/F converter. The results of performance test are given finally. The gauge is suitable for the thickness measurement of non magnetic conducting plating (coating) on magnetic conducting workpieces.

关 键 词：厚度测量 镀层 涂层 霍尔集成电路 线性化 单片机 

分 类 号：TG174.4[金属学及工艺—金属表面处理] TH821.1[金属学及工艺—金属学]