介质Ag/AgI镀层空芯玻璃光纤中AgI薄膜厚度的计算模型  

CALCULATION MODEL OF THE THICKNESS OF AgI FILM OF Ag/AgI HOLLOW GLASS WAVEGUIDES

作　　者：文天发[1] 高建平[1] 卞蓓亚[1] 沈菊云[1] 

机构地区：[1]中国科学院上海硅酸盐研究所,上海200050

出　　处：《硅酸盐学报》2001年第5期503-506,共4页Journal of The Chinese Ceramic Society

摘　　要：AgI薄膜的厚度是影响介质Ag/AgI镀层空芯玻璃光纤传输损耗的一个重要因素 .本研究推导出介质Ag/AgI镀层空芯玻璃光纤中AgI薄膜厚度 (h)的计算模型 ,即c(h ,t) =-C0 [1-2π∫h2Dt0 exp( -β2 )dβ] ;通过热场发射Auger微探针及电子探针测试了不同工艺条件下所制得的介质Ag/AgI镀层玻璃空芯光纤中AgI薄膜厚度 ,发现测试结果与理论计算值相吻合 .According to the theory of Miyagi and Kawakami, the thickness of AgI film is one of the factors, which greatly influencing the attenuation of the waveguides of Ag/AgI hollow glass. In this work, a mathematical model c(h,t)=-C 02 π ∫ h2Dt 0 · exp (-β 2) d β ] was put forward for the calculation of the thickness. By means of Auger electron spectroscopy and SEM scan the different thicknesses of AgI film of Ag/AgI hollow glass waveguides were measured and calculated by the model. There is a good agreement between the calculated values and experimental results. The calculated thickness provides a guide prior to the preparation of Ag/AgI hollow glass waveguides. was put forward for the calculation of the thickness. By means of Auger electron spectroscopy and SEM scan the different thicknesses of AgI film of Ag/AgI hollow glass waveguides were measured and calculated by the model. There is a good agreement between the calculated values and experimental results. The calculated thickness provides a guide prior to the preparation of Ag/AgI hollow glass waveguides.

关 键 词：空芯光纤 碘化银薄膜 计算模型 镀层 光纤玻璃 银 光纤传输损耗 介质 红外光纤 

分 类 号：TQ171.777[化学工程—玻璃工业] TN213[化学工程—硅酸盐工业]