Li^+离子嵌入V_2O_5干凝胶薄膜的XPS研究  

X-ray Photoelectron Spectroscopy Study on Lithium Implantation into Vanadium Pentoxide Xerogel Thin Films

作　　者：胡勇胜[1] 陈文[1] 徐庆[1] 郜定山[1] 

机构地区：[1]武汉理工大学材料科学与工程学院

出　　处：《硅酸盐通报》2001年第3期62-65,共4页Bulletin of the Chinese Ceramic Society

基　　金：国家自然科学基金资助项目 !(5 980 2 0 0 9) ;湖北省自然科学基会资助项目 !(99J0 5 3 )

摘　　要：V2 O5薄膜是最具有实用价值的全固态“灵巧窗”器件中候选锂离子储存材料之一。本研究采用熔融淬冷法成功制备了V2 O5溶胶 ,利用提拉法在ITO玻璃片上制备了表面均匀和无裂纹的V2 O5干凝胶薄膜 ,并采用电化学方法将Li+ 离子嵌入到V2 O5干凝胶薄膜中。本文着重采用X射线光电子能谱 (XPS)分析了Li+ 离子嵌入V2 O5干凝胶薄膜前后的化学组成及钒、氧。Vanadium pentoxide xerogel thin films are one of the best candidates of Li + ionic storage layers in all solid states“Smart Windows”devices.In this paper,the vanadium pentoxide sol was prepared by melting and quenching method and vanadium pentoxide xerogel thin films without visible cracks were coated homogeneously by dip coating on the ITO glass substrate.Li + ions were implanted into vanadium pentoxide xerogel thin films using electrochemical method.Compositions and chemical states of vanadium,oxygen and lithium were analyzed by X ray Photoelectron Spectroscopy (XPS)before and after Li + ions implantation into vanadium pentoxide xerogel thin films.

关 键 词：溶胶-凝胶法 W2O5 干凝胶薄膜 XPS 锂离子嵌入 五氧化二钒 

分 类 号：O484[理学—固体物理] TQ135.11[理学—物理]