电感耦合等离子体-光发射光谱中抑制易电离元素干扰研究的进展  

THE PROGRESS OF STUDY ON THE DEPRESSION OF INTERFERENCES OF EASILY IONIZED ELEMENTS IN ICP-OES

作　　者：陶锐[1] 高舸[1] 

机构地区：[1]成都市卫生防疫站,成都610021

出　　处：《理化检验（化学分册）》2001年第10期478-482,共5页Physical Testing and Chemical Analysis(Part B:Chemical Analysis)

摘　　要：从等离子体的强化状态、影响强化状态的分析参数及易电离元素对进样系统的影响三方面综述了电感耦合等离子体 光发射光谱分析中抑制易电离元素干扰的研究进展 ,引用文献 4A review on the progress of the study on the depression of interferences of easily ionized elements in ICP OES is given in this paper, pertaining especially to the robust condition of ICP, analytical parameters affecting the robust condition and the effect of EIE on the injection sampling system (46 references are cited).

关 键 词：电感耦合等离子体-光发射光谱 易电离元素干扰 强化状态 进样系统 

分 类 号：O657.31[理学—分析化学]