一种新的双魔T多状态反射计  

A Novel Multistate Reflectometer Comprised of Two Magic Tees

作　　者：田步宁[1] 刘其中[1] 唐家明[1] 杨德顺[1] 

机构地区：[1]西安电子科技大学天线与微波技术国家重点实验室,西安710071

出　　处：《微波学报》2001年第4期92-96,共5页Journal of Microwaves

基　　金：国防科技预研基金资助项目 (97J17.1.1.DZ0 14 5 )

摘　　要：介绍了一种新的多状态反射计。该反射计由两只魔 T和两个功率检测器组成。采用一只精密滑动短路器作标准 ,通过任意相位单位矢量五点校准法对其进行校准 ;另用一只精密滑动短路器来改变反射计状态。测量复反射系数采用矢量变换法。与传统的六端口反射计与多状态反射计相比 ,该反射计校准端口与测试端口相分离 ,具有结构简单、稳定性高。A novel multistate reflectometer comprised of two magic tees and two power detectors is described. Two precise sliding short circuits are used, one is used to perform the calibration of the reflectometer by a calibration method using five unit-vectors with arbitrary phase, and another is used to make the reflectometer switch to different stable states. A vector transfer method is employed to obtain the complex reflection coefficient of DUT. The reflectometer is characterized by separated test and calibration port, simple hardware, and high stability and easy realization compared to the traditional six-port and multistate reflectometer.

关 键 词：多状态反射计 工作原理 微波器件 

分 类 号：TN62[电子电信—电路与系统]