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作 者:倪元龙[1] 毛楚生[1] 吴江[1] 余松玉 周正良[1] 傅思祖[1] 顾援[1] 王世绩[1]
机构地区:[1]中国工程物理研究院上海激光实验室
出 处:《强激光与粒子束》1991年第2期242-248,共7页High Power Laser and Particle Beams
摘 要:介绍用于X光激光研究的平焦场光栅光谱仪的原理、结构、调整方法及实验考核结果。谱仪采用名义刻线为1200L/mm的变栅距凹面光栅,入射角为87°,摄谱范围为5~30nm。给出了谱仪用底片作时间积分记录时,谱分辨为0.01nm;用国产软X光扫描相机作时间分辨记录时,谱分辨为0.05nm,时间分辨本领约为30ps。The principle, structure, and adjustment of a flat field grating spectrograph are presented. A varied line space grating with no minal line spacing 1200L/mm is used in this spectrograph, The incidence angle is 87℃, and spectral range of detection is 5~30 nm. Both experimental results of the instrument for time integrating detection using the film and time resoluting detection using a streak camera are presented as well.The spectral resolution are 0.Olnm and O.05nm , respectively. The temporal resolution is ~30ps. Finally, the evaluation is given.
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