航天单粒子事件故障注入系统研究  

Study on Aerospace SEP Fault Injection System

作　　者：李华旺[1] 刘海涛[1] 杨根庆[1] 

机构地区：[1]中国科学院上海冶金研究所传感技术国家重点实验室,上海200050

出　　处：《量子电子学报》2002年第1期57-60,共4页Chinese Journal of Quantum Electronics

摘　　要：本文介绍了一种基于内存故障注入和总线故障注入相结合的单粒子事件故障注入系统．首先介绍了故障注入系统的功能及框架，然后以通用性和可扩展性为前提，对实现故障注入器的关键技术进行了探讨．测试结果表明。利用本文介绍的故障注入系统，具有成本低、通用性强、故障注入方便快捷、全动态实时和定量注入等特点．In this paper, the aerospace SEP(Single Event Phenomenon) fault injection system based on inserting fault both in the memory and through the bus is presented. The structure and functions of FIS(fault injection system) are firstly introduced. On the basis of expansibility and universality, the study is concentrated on the key implementation technology in fault insertion unit. The practical results show that the FIS is low cost, high universality, fully dynadrically and real-timely inserted.

关 键 词：单粒子事件 故障注入系统 测试 容错 航天 

分 类 号：V448.15[航空宇航科学与技术—飞行器设计]