超低副瓣天线平面近场测量取样方式的新准则  

New sampling criterion for the measurement of ultralow side-lobe antennas in planar near-field technique

作　　者：张福顺[1] 焦永昌[1] 刘其中[1] 毛乃宏[1] 

机构地区：[1]西安电子科技大学天线与电磁散射研究所,陕西西安710071

出　　处：《电波科学学报》2001年第4期437-440,共4页Chinese Journal of Radio Science

基　　金：西安电子科技大学天线与微波技术重点实验室基金资助项目 (99JS0 7.4 .1.ZS0 70 1)

摘　　要：采用实验的方法给出了用平面近场技术测量超低副瓣天线时收发天线之间的近区测试距离以及取样密度的选取准则 ,提出了超低副瓣天线测量对测试系统温度漂移的要求 ,并给出了满足系统温度漂移要求的测试方式。依据新的选取准则 ,实测了最佳角锥喇叭和波纹喇叭天线的 E面方向图。测试结果说明 ,该选取准则具有良好的重复性 ,且重复精度为 60 d B± 2 dMethod, The criterion for suitably choosing the near field test distance and the sampling interval in the measurement of ultra low side lobe antennas with planar near field scanning is presented by using the experiment in this paper. The requirements of the temperature shift in the measurement system are also proposed for the near field ultra low side lobe antenna measurement, and the test method, which satisfies the temperature shift, is suggested. Finally, the E plane patterns of the optimal pyramidal horn and the corrugated horn are measured with the new sampling criterion. The test results show that this sampling criterion is of good repeatability and that the repeatable precision is 60dB±2dB.

关 键 词：超低副瓣天线 平面近场测量 取样间距 采样密度 取样方式 

分 类 号：TN82[电子电信—信息与通信工程]