原子力显微镜与透射电镜对比研究嵌段共聚物微相分离形态  

A Comparative Study on Morphology of Block Copolymer Using Atomic Force Microscopy and Transmission Electronics Microscopy

作　　者：王铀[1] 李英顺[2] 宋锐[2] 沈静姝[2] 龙程奋[2] 

机构地区：[1]哈尔滨工业大学应用化学系,哈尔滨150001 [2]中国科学院化学研究所,北京100080

出　　处：《高等学校化学学报》2001年第11期1940-1942,共3页Chemical Journal of Chinese Universities

基　　金：国家基础研究重大关键项目"高分子凝聚态基本物理问题研究"及高分子物理实验室基金资助

摘　　要：The morphology of poly(styrene ethylene/butylene styrene)(SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy(AFM) with transmission electronics microscopy(TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.The morphology of poly(styrene ethylene/butylene styrene)(SEBS) triblock copolymer cast from heptane and toluene was studied by combining atomic force microscopy(AFM) with transmission electronics microscopy(TEM). The quantitative agreement of the results of AFM and TEM plays a key role in determining the phase attribution for the AFM images. It is confirmed that under the moderate tapping condition, the hills in AFM height images correspond to the polystyrene phase and the valleys to the rubbery phase.

关 键 词：原子力显微镜 透射电镜 微观相分离 形态 嵌段共聚物 结构 

分 类 号：O631.1[理学—高分子化学]