锆英石质耐火材料的X射线荧光光谱分析法  

X-ray fluorescence spectrometry analysis of zircon refractories

作　　者：胡坚[1] 郭红丽[1] 杜军卫[1] 宋霞 

机构地区：[1]洛阳耐火材料研究院,洛阳471039 [2]洛阳耐火材料集团有限公司

出　　处：《耐火材料》2002年第1期46-47,50,共3页Refractories

摘　　要：以少量自然标样与光谱纯氧化锆配制出锆英石标样系列 ,采用混合熔剂熔融制样 ,用DJ数学模型的经验系数法校正基体效应 ,建立了锆英石质耐火材料的X射线荧光光谱分析法。该分析方法的精密度和准确度完全可与化学法媲美。A series of zircon trade samples were compounded by mixing a few of natural trade sample and spectrometric ZrO 2 and then melted by the flux containing Li 2B 4O 7 and Li 2CO 3.The coefficient method of DJ mathematical model was used to correct the matrix effect and then measure the main elements in the zircon refractories. The method almost has the similar precision and accuracy to that of chemical analysis.

关 键 词：锆英石质耐火材料 X射线荧光光谱法 锆英石标样系列 混合熔剂 熔融制样 

分 类 号：TQ175.715[化学工程—硅酸盐工业] TQ175.66