充Xe多丝室中Xe的KX射线对成像性能影响的MC模拟  

MC simulation study of X-ray image in a high pressure xenon gas chamber

作　　者：傅成栋[1] 汪晓莲[1] 李澄[1] 许咨宗[1] 

机构地区：[1]中国科学技术大学近代物理系,合肥230026

出　　处：《核技术》2002年第3期183-188,共6页Nuclear Techniques

基　　金：国家自然科学基金 (19775 0 4 5 )资助

摘　　要：对不同能量 (2 0— 10 0keV)的X射线在充 3个大气压Xe的多丝室中与Xe原子相互作用的过程进行了蒙特卡罗模拟研究 ,讨论康普顿散射和Xe的特征X射线对高气压丝室的定位性能的影响 ,并通过对低密度试模成像的模拟 ,观察KX射线在高气压丝室中引起的图象畸变。The multi- wire proportional counter (MWPC) has been intensively applied to the image formation measurement in high energy physics. The interaction of various energy X-rays (20—100keV) with Xe atoms in a MWPC filled with high pressure Xe gas was studied by Monte Carlo simulation. The influence of scattered X-ray and Xenon's KX-ray on the accuracy of position determination with the counter was investigated. The distortion of image coused by scattered and KX-rays was studied by low density virtual model simulation. A method was proposed to correct the image distortion.

关 键 词：高气压丝室 KX射线 MC模拟 氦 成像性能 X射线成像 蒙特卡罗模拟 多丝正比室 

分 类 号：R812[医药卫生—放射医学] TL811.1[医药卫生—临床医学]