一种基于电压比较器衬底噪声的测试方法  

A Voltage-Comparator-Based Measuring Method of Substrate Noise

作　　者：师奕兵[1] 陈光 王厚军[1] Jiann S.Yuan 

机构地区：[1]电子科技大学自动化工程学院,成都610054 [2]美国中佛罗里达大学工程与计算机科学学院,奥兰多fl32816

出　　处：《电子科技大学学报》2002年第1期35-38,共4页Journal of University of Electronic Science and Technology of China

基　　金：国家留学基金管理委员会基金资助项目编号97339004

摘　　要：论述了一种测试混合信号集成电路衬底噪声波形的方法采用电压比较器利用衬底电压对比较器状态的影响对噪声作出统计测试根据测试结果重建噪声波形设计了一测试系统的原理框图推导出了用于衬底噪声波形重建的表征取样噪声电压的平均电压和表征测试误差的均方根值的计算公式建立了模拟实验电路给出了SPICE模拟实验结果The measurement of substrate noise waveforms in mixed-signal integrated circuits is described in this paper. This method uses voltage comparators as on-chip noise detectors. From the influence of substrate noise on the comparator抯 state, the noise can be measured statistically. The substrate noise waveform can be reconstructed by using the measured results. The block diagram of a test system is designed. The formula of the equivalently sampled noise voltage and the test error are deduced. The experimental result through SPICE simulation is given based on the experimental circuits set up along with their substrate models.

关 键 词：混合信号集成电路 衬底噪声 电压比较器 测试 

分 类 号：TN4[电子电信—微电子学与固体电子学]