X射线衍射在纳米材料物理性能测试中的应用  

Application of XRD analysis to testing physical properties of nano-materials

作　　者：张泽南[1] 

机构地区：[1]浙江工业大学理学院,浙江杭州310032

出　　处：《浙江工业大学学报》2002年第1期31-35,共5页Journal of Zhejiang University of Technology

摘　　要：借助X射线衍射 (XRD)试验 ,测定纳米SiO2 和纳米CaCO3的微观结构 ,采用半定量法(QXRD)测定了纳米SiO2 与普通Ca(OH) 2 和水泥硬化浆体界面中Ca(OH) 2 的反应程度 ,以及在水泥硬化浆体界面中Ca(OH) 2 晶体的取向程度 ,试验结果表明纳米SiO2 能大幅度地降低这种取向程度。同时采用基本参数法和谢乐公式法计算了在水泥硬化浆体界面中Ca(OH) 2 的晶粒尺寸 ,得到纳米SiO2 有细化Ca(OH) 2 晶粒作用的结论。Microstructure of nano\|powder, reaction processes, crystal orientation and crystallite size was studied by X-ray diffraction. Results indicated that nano\|SiO\-2 was amorphous substance and nano\|CaCO\-3 was crystal. Reaction process between nano\|SiO\-2 and Ca(OH)\-2 was determined in the interface between hardened cement paste and marble. The crystallite size of portlandite was calculated by the Fundamental Parameters Approach. And it is found that the orientation degree and the crystallite size of portlandite in the interface were decreased with nano-SiO\-2 added.

关 键 词：X射线衍射 纳米SIO2 反应过程 取向程度 晶粒尺寸 纳米材料 二氧化硅 物理性能测试 

分 类 号：TB383[一般工业技术—材料科学与工程]