单O型圈密封结构中双层密封泄漏机理研究  

Mechanism research of double seal leakage in single-O-ring seal structure

作　　者：郭崇武 孙立臣[1] 孙立志[1] 齐飞飞[1] 李文斌[1] GUO Chong-wu;SUN Li-chen;SUN Li-zhi;QI Fei-fei;LI Wen-bin(Beijing Institute of Spacecrafi Environment Engineering,Beijing 100094,China)

机构地区：[1]北京卫星环境工程研究所,北京100094

出　　处：《真空》2018年第6期19-23,共5页Vacuum

摘　　要：某航天单O型圈密封结构单机产品真空检漏试验中,漏率曲线持续缓慢上涨并出现"尖角"现象,类似典型双层弹性密封现象,此现象影响检漏结果的可靠性,因此弄清楚这一现象对后续的检漏试验是非常必要的。本文建立了双密封结构泄漏过程的数学模型,从而在理论上解释了此类现象发生的原因,并设计了实验工装,对实验结果进行了现象分析。这对后续的检漏试验具有一定的指导意义。During the vacuum leak detection testing of standalone product for single-O-Ring seal model, the leakage rate curve demonstrates continuous and tardy up-trend. Moreover, sharp corner phenomenon appears that is similar to the typical double-deck elastic seal. It is essential to thoroughly study this issue for subsequent leak detection, as this issue has impact on the reliability of testing results. In this paper, the reason was located theoretically, by establishing the mathematical model to simulate the leakage process of double seal structure. Besides, the working sets has been designed and the experimental results were analyzed adequately. These researches may have guiding significance for the leak detection testing in the future.

关 键 词：检漏 真空 单O型圈密封结构 双层密封结构 

分 类 号：TB774[一般工业技术—真空技术]