一种星载微波开关在轨可靠性验证试验设计  

Design for On-orbit Reliability Verification Test for a Microwave Switch Onboard Satellite

作　　者：操基德[1] 徐丽丽 杨倩[1] Cao Ji-de;Xu Li-li;Yang Qian(The 40th Institute of China Electronics Technology Group Corporation,Anhui Bengbu 233010;College of information,Zhejiang Ocean University,Zhejiang Zhoushan 316004)

机构地区：[1]中国电子科技集团公司第四十研究所,安徽蚌埠233010 [2]浙江海洋大学数理与信息学院,浙江舟山316004

出　　处：《电子质量》2018年第12期43-46,共4页Electronics Quality

摘　　要：提出了一种基于产品结构特点与实际应用状态,结合传统可靠性试验技术的试验验证思路。结合某星载大功率微波开关实例进行了可靠性验证试验的设计,验证了该方法的实用可行性与工程化前景。Presented is an idea for test verification based on the product structure features and real use status in conjunction with traditional reliability test technologies.Reliability verification test is designed,combined with a high power microwave switch onboard satellite as an example.The method is verified for its practice feasibility and shown for its prospect for engineering.

关 键 词：星载微波开关 可靠性验证 

分 类 号：V443[航空宇航科学与技术—飞行器设计]