多稳态系统随机P-分岔现象电路实验研究  

Circuit experimental research of stochastic P-bifurcation in multi-stable systems

作　　者：吴志强[1] 王质斌 张宝强[1] Wu Zhiqiang;Wang Zhibin;Zhang Baoqiang(School of Mechanical Engineering,Tianjin University,300350,Tianjin,China)

机构地区：[1]天津大学机械工程学院,天津300350

出　　处：《应用力学学报》2018年第6期1177-1184,1413,共9页Chinese Journal of Applied Mechanics

基　　金：国家自然科学基金资助的课题(11372211)

摘　　要：随机动力学实验验证是非线性随机动力学研究的难点问题。本文基于van der Pol电路,重点讨论多稳态系统中的随机P-分岔现象,分别探究了噪声强度、阻尼系数变化对随机动力学响应的影响,定性验证了随机P-分岔结果,即噪声强度、阻尼系数变化都能导致幅值概率密度峰的数目变化。为进一步开展多稳态系统随机动力学实验研究奠定较好的基础。Experimental verification of stochastic dynamics is usually difficult in the study of nonlinear stochastic dynamics.Based on the van der Pol circuit,the stochastic P-bifurcation phenomena of the multi-stable system are discussed.Influences of noise intensity and damping coefficient on stochastic dynamics response are studied, respectively.The results of stochastic P-bifurcation are verified qualitatively,that was,the change of noise intensity and damping coefficient could lead to the change of the number of amplitude probability density peaks.It may lay a good foundation for further experimental investigation of stochastic dynamics of multi-stable systems.

关 键 词：VAN der Pol电路 多稳态系统 随机P-分岔 

分 类 号：O322[理学—一般力学与力学基础]