成像光学系统杂光系数分析与计算  

Analysis and Calculation of Veiling Glare Index of Optical ImagingSystems

作　　者：孙林 崔庆丰[1] Sun Lin;Cui Qingfeng(College of Opto-Electronic Engineering,Changchun University of Science and Technology,Changchun,Jilin 130022,China)

机构地区：[1]长春理工大学光电工程学院,吉林长春130022

出　　处：《激光与光电子学进展》2018年第12期502-506,共5页Laser & Optoelectronics Progress

基　　金：国家重大科技专项高分专项(51-H34D01-8358-13/16)

摘　　要：杂光系数是评价光学系统成像质量的重要指标之一。一般情况下,杂光系数只有在光学系统加工完成之后,才能运用实测方法得到,且如果实测结果不理想,需对光学系统的杂光抑制方法进行调整以增强其抑制效果。针对上述问题,提出了一种在光学设计阶段求得杂光系数的方法。该方法运用光学仿真软件TracePro为光学系统建模、分析和光线追迹,运用数学分析软件Matlab对仿真结果进行拟合,最终求出杂光系数。该方法的优点是将杂光系数的分析与计算提前,准确评价光学系统的杂光抑制能力。The veiling glare index is a key criterion used to evaluate the image quality of optical systems.In general,the stray light coefficient can only be obtained with the actual measurement method after the optical system is processed.If results of actual measurement are unsatisfactory,then the method of suppressing stray light in the optical system must be adjusted to optimize its suppression effect.To overcome these questions,this study proposes a method for solving the veiling glare index during optical design.This method employs TracePro software to establish and analyze the optical system as well as trace rays.Matlab software is used to fit the simulation results and solve the veiling glare index.The proposed method can successfully calculate and analyze the veiling glare index in advance and accurately evaluate the stray light suppression of the optical system.

关 键 词：成像系统 杂光 杂光系数 成像光学系统 杂光抑制 

分 类 号：O436[机械工程—光学工程]