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机构地区:[1]中国电子技术标准化研究院
出 处:《信息技术与标准化》2018年第12期41-44,59,共5页Information Technology & Standardization
摘 要:研究使用统计方法分析化学检测中线性回归标准曲线的稳定性,采用F检验和t检验对不同时期建立的标准曲线方程中剩余标准差、斜率和截距三个参数之间差异进行了深入研究,同时使用该方法对原子荧光光谱法测定电器电子产品中六价铬中的标准曲线稳定性进行分析。结果表明原子荧光光谱法测定电器电子产品中六价铬的方法稳定、可靠,同时也证明该统计分析方法可用于化学检测中方法稳定性的分析。The stabilization of linear regression calibration curve in chemical testing is studied by statistical analysis method.The significance test for the difference of residual standard deviation,slope and intercept of calibration curves that were setup in different times was studied deeply by F-test and t-test,and then the stabilization for the calibration curves of testing Cr(VI) in electrical and electronic products by using AFS was analyized by this method.The results show that the method of testing Cr(VI) in electrical and electronic products by using AFS is stable and credible,and then the significance test of statistical analysis can using in analyizing for the stabilization of linear regression calibration curve in chemical testing.
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