用于绝缘子表面电荷测量的电容探头法的标度问题  

CALIBRATION OF CAPACITIVE PROBE MEASUREMENT FOR INSULATOR SURFACE CHARGE

作　　者：汪沨[1] 胡红利[1] 张乔根[1] 陈庆国[1] 邱毓昌[1] 

机构地区：[1]西安交通大学电气工程学院,陕西西安710049

出　　处：《高压电器》2002年第2期40-43,共4页High Voltage Apparatus

基　　金：教育部高校博士点基金资助项目 (2 0 0 10 6 980 14 );国家自然科学基金资助项目 (5 980 70 0 6 )

摘　　要：80年代初 ,电容探头测量绝缘子表面电荷技术开始应用于高压领域 ,但由于问题的复杂性 ,该方法无论是在原理上还是在技术上都还有待于进一步完善。笔者综述了这一技术的原理。In early 1980's, the capacitive probe measurement technique was employed in the field of high voltage engineering for surface charge measurement on insulator surface. Owing to the complexity of the problem, the principle of charge measurement in this case is neither fully understood nor well established. This paper reviews the basic principle of surface charge measurement, and the recent results acquired by some investigators and the further research topics.

关 键 词：绝缘子 表面电荷 测量 电容探头法 标度 

分 类 号：TM934[电气工程—电力电子与电力传动]