超导双面膜T_c与J_c的无损测量系统  

NON-DESTRUCTIVE DETERMINATION SYSTEM OF CRITICAL PARAMETERS OF DOUBLE-SIDED HTSC THIN FILMS

作　　者：李顺洲[1] 孙永伟[1] 何艾生[1] 董世迎[1] 王小平[2] 何豫生[1] 

机构地区：[1]中国科学院物理所 [2]北京有色金属研究总院,北京100088

出　　处：《低温物理学报》2002年第2期133-136,共4页Low Temperature Physical Letters

摘　　要：利用高温超导体磁屏蔽原理研制了一种双面超导薄膜的临界参数无损测量系统 .该系统有 2 9个传感器 ,可以无损地测出双面薄膜中的任一面的临界参数 (Tc、Jc)值 .该系统用液氮冷却 .可测量最大薄膜直径为 75mm .全系统由计算机实现自动控制 .With the development of HTSC double sided films, a simple, fast, and nondestructive determination system for the quality of the films is necessary. In this paper, a new type of equipment to determine critical parameters of HTSC double sided films by using magnetic shielding principle is introduced. This equipment can determine both T\-c and J\-c of 30 points on double sided films with diameters less than 75mm(or 50mm). The determination is non destructive and computer controlled.

关 键 词：超导双面膜 TC JC 无损测量系统 高温超导体 临界参数 超导磁屏蔽 超导微波器件 

分 类 号：O514[理学—低温物理]