数字系统单加权集下随机测试生成方法  

Random Pattern Generation with Single Weighted Set for Digital Systems

作　　者：谢永乐[1] 陈光禑[1] 

机构地区：[1]电子科技大学CAT研究室,成都610054

出　　处：《计算机辅助设计与图形学学报》2002年第5期471-474,共4页Journal of Computer-Aided Design & Computer Graphics

摘　　要：为在不引入额外的硬件开销下以较短的测试序列获得较高的故障覆盖率 ,提出一种基于细胞自动机 (CA )的数字集成电路加权随机测试方法 .该方法利用可测性测度建立反映故障侦查代价的可测性代价函数 ,对此函数的寻优得到被测电路主输入处的权值 ,再由一维混合型 CA实现了该权值下的随机序列 .对标准电路的实验验证了该方法是一有效的、且便于 BIST应用的测试生成算法 .In order to obtain higher fault coverage with shorter sequence length and no additional hardware overhead, we presented a weighted random test approach of digital integrated circuits based on Cellular Automata (CA). The approach adopted probabilistic testability measure to establish the Testability Cost Function (TCF) which reflects the cost of fault diagnosis. By an optimization procedure for TCF, weights at primitive inputs of circuit under test are obtained. With the aid of one dimensional hybrid CA, random sequence corresponding to the weight is realized. Experimental results on benchmark circuits prove the effectiveness and convenience of the proposed test generation methodology for BIST application.

关 键 词：故障诊断 细胞自动机 线性反馈移位寄存器 数字集成电路 数字系统 单加权集 随机测试生成方法 

分 类 号：TN431.2[电子电信—微电子学与固体电子学]