用OCV细分干涉条纹技术的研究  

THE STUDY OF THE FINE DIVIDING TECHNIQUE FOR UNITY INTERFERENCE FRINGE BY USING OCV

作　　者：任明善[1] 朱长纯[2] 万长虹[2] 

机构地区：[1]西安交通大学物理系 [2]西安交通大学电子工程系

出　　处：《西安交通大学学报》1991年第1期199-222,118,共25页Journal of Xi'an Jiaotong University

基　　金：国家自然科学基金

摘　　要：本文介绍了一种采用光控变容二极管来细分干涉条纹技术。光控变容二极管(OVC)是一种新型半导体器件。用计算机系统采集并处理数据,能够计数和细分干涉条纹,并已获得较高的灵敏度(超过1/90条)。该技术的优点在于它的可靠性,经济性、简单而且速度高。A new technique of fine dividing interference fringe by an optically controlled varactor is reported in this paper. The optically controlled varactor (OCV) is a new semiconductor device. Counting and dividing interference fringe have reached higher sensitivity (over 1/90 fringe) by using computer system for collecting and treating date. The advantages of this technique are reliability, economy, simpleicity and high-speed.

关 键 词：OCV 细分 干涉条纹 光电探测器 

分 类 号：TP216.3[自动化与计算机技术—检测技术与自动化装置]