补充加料过程中逃逸电子的雪崩现象  

AVALANCHE PHENOMENON OF RUNAWAY ELECTRONS DURING SUPPLEMENTARY FUELLING

作　　者：杨进蔚[1] 唐年益[1] 曾庆希[1] 张炜[1] 曹建勇[1] 董贾福[1] 肖正贵[1] 姚良骅[1] 

机构地区：[1]核工业西南物理研究院,成都610041

出　　处：《核聚变与等离子体物理》2002年第2期95-99,共5页Nuclear Fusion and Plasma Physics

基　　金：国家自然科学基金资助项目 (10 175 0 2 1) ;中国核科学基金资助项目 (J95CO30 0 7)

摘　　要：在靶丸注入和超声分子束注入等补充加料期间 ,虽然等离子体密度骤然增加 ,但用五通道碘化汞探测器阵列及碘化钠探测器在此期间均测到很强的X射线辐射 ,且射线峰爆发时间与靶丸注入及超声分子束注入时间对应得相当好。用二次电子发射形成雪崩型逃逸电子理论解释了实验测量结果。During pellet injection and supersonic molecular beam injection (SMBI),though the electron density increased rapidly,the enhancement of hard X ray radiaton has been measured with the five channel HgI 2 detector array and NaI detectors.The eruption of X rays is highly correlated with the pellet injection or SMBI.The experimental results have been explained with the avalanche of runaway electrons due to secondary electron emission.

关 键 词：逃逸电子 雪崩现象 补充加料 靶丸注入 分子束注入 等离子体 托卡马克 

分 类 号：TL624[核科学技术—核技术及应用] TL612.1