纳米粒子晶格畸变率的数量级研究  

Probe of Scale of Crystal Lattice Distortion Rates of Nanometer Particles

作　　者：刘建路[1] 张其春[1] 林金辉[2] 

机构地区：[1]成都理工大学应用化学系 [2]成都理工大学材料科学与工程系,成都610059

出　　处：《材料导报》2002年第6期71-73,共3页Materials Reports

摘　　要：晶格畸变率是纳米柱子的一个重要参数。用X射线衍射积分宽度法确定了纳米CeO_2粒子的晶格畸变率,研究了晶格畸变与晶粒度之间的关系,结合已有资料讨论了纳米粒子晶格畸变率的数量级大小。结果表明,不合理的计算方法可能会导致计算出来的晶格畸变值严重失实。Crystal lattice distortion rate is a key parameter of nanometer particles-Crystal lattice distortion rates of the ceria samples of nanometer size were determined by integral breadth method of X ray diffraction.The relation between crystalline grain sizes and crystal lattice distortion rates was studied.The scale of crystal lattice distortion rates of nanometer particles was discussed based on existing data.The results showed that using some unreasonable treating methods as adopted by some authors may lead to a seriously deviated value when calculating the crystal lattice distortion rate of samples of fine crystalline grains.

关 键 词：畸变率 数量级 纳米粒子 晶格畸变 X射线衍射 积分宽度法 二氧化铈 结构 

分 类 号：TB383[一般工业技术—材料科学与工程] O712[理学—晶体学]