Zernike多项式拟合方法及应用  

Zernike polynomial fitting method and its application

作　　者：单宝忠[1] 王淑岩[1] 牛憨笨[1] 刘颂豪[2] 

机构地区：[1]深圳大学光电子学研究所,广东深圳518060 [2]华南师范大学量子电子学研究所,广东广州510631

出　　处：《光学精密工程》2002年第3期318-323,共6页Optics and Precision Engineering

摘　　要：由于Zernike多项式的各项与光学像差有相应的对应关系 ,用Zernike多项式对镜面面形数据进行处理的方法已经广泛应用于工程项目、光学系统设计软件和干涉检查等。用Zernike多项式作为光学和结构分析程序间的接口工具是非常方便和成熟的。本文阐述了Zernike多项式及其拟合方法和应用流程 ,并应用它作为数据接口工具实现了光机热各分析模块间的数据转换 。The items of Zernike polynomials have corresponding meanings of Seidel aberrations. The method of using Zernike polynomials to fit optical surfaces has been widely used in project, optical design software and interference check. So it is convenient and mature to use Zernike polynomials as the data transmission tool between optical and structural analysis programs. Here, Zernike polynomials and their fitting method, fitting process are outlined, and are used in the integrated analysis of a space camera, as an example.

关 键 词：ZERNIKE多项式 拟合 集成分析 有限元法 光机系统 

分 类 号：TH74[机械工程—光学工程]