电子与多电荷离子的碰撞电离(英文)  

Electron-impact Ionization of Multiply-charged Ions

作　　者：K.Aichele W.Arnold D.Hathiramani F.Scheuermann E.Salzborn 

机构地区：[1]德国吉森大学核物理研究所

出　　处：《原子核物理评论》2002年第2期144-146,共3页Nuclear Physics Review

摘　　要：主要揭示了不同电离机制对高电荷态离子单电离和多重电离的贡献 ,包括直接电离 (一步过程 )、激发 自电离 (两步过程 )以及内壳Auger过程 ,研究了高电荷态镨离子的电子碰撞电离 .Electron-impact ionization of ions is one of the most fundamental processes in every kind of plasma. Especially in high-temperature plasmas-whether in laboratory (nuclear fusion) or in astrophysics (atmosphere of stars)-atoms become ionized into multiply-charged ions by electron impact. The main purpose of our investigations is to unravel the contributions from different ionization mechanisms-like direct ionization (one-step process), excitation-autoionization (two-step process) and inner-shell Auger processes to the cross sections of single and multiple ionization of highly-charged ions. As the experimental database is still rather small, theoretical cross sections are often used for the calculation of different plasma parameters. Cross sections for ions with an outer 4f shell are usually small and experimental data is needed in order to test theories in that region. In the present study, we investigate the ionization of praseodymium ions, where cross section data has not been available up to now.

关 键 词：激发 电离 电子碰撞 多电荷离子 

分 类 号：O562.4[理学—原子与分子物理] O562.5[理学—物理]