表面弯曲的古陶瓷样品X射线荧光无损定量分析  

A method of non-destructive quantitative analysis of the ancient ceramics with curved surface

作　　者：何文权[1] 熊樱菲[1] 

机构地区：[1]上海博物馆文物保护与考古实验室,上海200231

出　　处：《核技术》2002年第7期581-586,共6页Nuclear Techniques

摘　　要：常规X荧光分析中对样品表面有较高要求 ,这大大影响了利用X射线荧光法对古陶瓷无损分析的进行。本文提出了基本参数法和经验系数法中的两种较为简单的处理方法 。Generally the surface of the sample should be smooth and flat in XRF analysis, but the ancient ceramics can hardly match this condition. Two simple methods are put forward in fundamental method and emperical correction method of XRF analysis, so the analysis of little sample or the sample with curved surface can be easily completed.

关 键 词：XRF 古陶瓷 无损分析 基本参数法 

分 类 号：O571.33[理学—粒子物理与原子核物理]