滤材样品在γ能谱分析中的真符合校正研究  

Studies on the true coincidence correction in measuring filter samples by γ spectrometry

作　　者：连琦[1] 李琦[1] 常永福[1] 夏兵[1] 

机构地区：[1]西北核技术研究所,陕西西安69号信箱14分箱710024

出　　处：《核电子学与探测技术》2002年第4期289-292,共4页Nuclear Electronics & Detection Technology

摘　　要：研究了高效率 HPGe探测器测量滤材样品的真符合校正。分析了子核具有三个激发态的典型核衰变情况下的级联校正情况 ,具体给出了测量滤材源的情况下具有代表性的符合校正因子计算的解析表达式。实验中通过测量 8种‘单能’核素点源在探测器表面各点的相对效率以及其滤材样品效率 ,拟合得到了 HPGe探测器的峰效率曲面和总效率曲面的解析表达式 ,使用该曲面计算的60 Co和152 Eu的真符合校正因子与实验测量结果基本一致。The true coincidence correction in measuring filter samples has been studied by high efficiency HPGe γ detectors. The true coincidence correction for a specific three excited levels de-excitation case has been analyzed, and the typical analytical expressions of true coincidence correction factors have been given. According to the measured relative efficiency on the detector surface with 8 'single' energy γ emitters and efficiency of filter samples, the peak and total efficiency surfaces are fitted. The true coincidence correction factors of 60Co and 152Eu calculated by the efficiency surfaces agree well with experimental results.

关 键 词：Γ能谱 真符合校正 滤材样品 HPGE探测器 校正因子 效率 γ射线探测 

分 类 号：TL816.2[核科学技术—核技术及应用]