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作 者:胡献明[1] 潘建伟[1] 陈虹[1] 朱睦元[1]
机构地区:[1]浙江大学遗传学研究所
出 处:《浙江大学学报(农业与生命科学版)》2002年第4期383-386,共4页Journal of Zhejiang University:Agriculture and Life Sciences
基 金:国家自然科学基金 (39770 4 2 0 ;30 10 0 115 );浙江省自然科学基金 (30 0 2 5 5 )
摘 要:利用超微弱发光分析技术对酸铝胁迫下不同耐铝性大麦品种的根尖的超微弱发光变化进行了初步的研究。结果表明 ,在大麦种子正常萌发过程中 ,2个不同耐铝性大麦品种的根表现出不同的发光曲线。在铝胁迫过程中 ,4个不同耐铝性大麦品种的根尖发光值大小依次为 :沪麦 8号 浙皮 2号 >早熟 3号 >嵊县无芒六棱。这一顺序与用根生长率鉴定的耐铝性能力大小的排列顺序相一致 ,说明可以用根尖超微弱发光的大小来鉴定大麦品种的耐铝性。Ultraweak luminescence (UL) analysis technology plays an important role in plant researches (such as plant growth, development, senescence, death, disease resistance, and stress resistance against adverse environment). UL changes of root tips in different aluminum resistant barley cultivars were examined under aluminum stress in this study. Our data revealed that roots of two barley cultivars that differed in their aluminum resistance gave different UL curves during normal seed germination. UL values of root tips in four barley cultivars under aluminum stress ranked as follows: Humai 8Zhepi 2>Zhaoshu 3>Shengxian six rows. This order was consistent with the ranking of their aluminum resistance as assessed by root growth rates. These results prove that UL analysis technology is valuable as a method for assessment of aluminum resistance in barley.
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