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作 者:李英[1] 谢裕生[1] 陈运法[1] 龚江宏[2] 唐子龙[2] 张中太[2]
机构地区:[1]中国科学院化工冶金研究所,北京100080 [2]清华大学材料科学与工程系,北京100084
出 处:《无机材料学报》2002年第4期811-816,共6页Journal of Inorganic Materials
摘 要:在313~473K温度范围内测定了一种Y2O3稳定ZrO2材料(YSZ)的交流电导率谱,进而导出了材料的直流电导率并分析了其随温度的变化关系.研究发现:在低温下材料的电导活化能随温度的升高而增大.这一实验现象与在高温下所观察到的活化能随温度升高而降低的规律截然相反.通过分析材料中氧空位的解缔及迁移机制,对YSZ材料中电导活化能随温度的变化关系作出了一个合理的解释.The ac conductivity spectra were measured in the temperature range from 313 to 473K for a Y2O3-stabilized ZrO2 (YSZ). Then the dc conductivity was deduced and its temperature dependence analyzed. It was shown that, at low temperatures, the activation energy for conduction in YSZ increases with increasing temperature. This experimental phenomenon is rather different with those observed previously in the high temperature range in which the activation energy was found to decrease with increasing temperature. Based on the analyses of the mechanisms for disassociation and migration of oxygen vacancies in the materials, a reasonable explanation for the temperature dependence of the activation energy for conduction in YSZ was proposed.
关 键 词:ZrO2基固体电解质 离子电导率 电导活化能 缺陷缔合 二氧化锆 氧化钇
分 类 号:TM2[一般工业技术—材料科学与工程] O482.4[电气工程—电工理论与新技术]
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